Digital Systems Testing

Course Name: 

Digital Systems Testing(CS358)


B.Tech (CSE)




Programme Specific Electives (PSE)

Credits (L-T-P): 



Introduction to Testing: Testing Philosophy, Role of Testing, Analog and Digital Circuit Testing, Types of Testing.
Fault Modeling: Defects, Errors, and Faults; Functional Versus Structural Testing; Levels of Fault Models; Fault
Equivalence and Fault Collapsing. Test Methods: Logic and Fault Simulation, Simulation for Design Verification,
Simulation for Test Evaluation, Modeling Circuits for Simulation, Algorithms for Fault Simulation. Test Generation:
Combinational Circuit Test Generation- Structural vs. Functional Test, ATPG Algebras, Test Generation Systems,
Test Compaction; Sequential Circuit Test Generation. Memory Test and Built-In-Self-Test: Memory Density and
Defect Trends, Memory Test Levels, March Tests, RAM Test Hierarchy, Cache RAM and Functional ROM Chip
Testing, Memory Built-In Self-Test. Delay Test: Delay Test Problem, Path-Delay Test, Transition Faults, Delay Test
Methodologies. Logic Fault Diagnosis: Combinational Logic Diagnosis, Scan Chain Diagnosis, Logic BIST


Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, Michael L. Bushnell, Vishwani D. Agrawal, KLUWER ACADEMIC PUBLISHERS, 1 st Edn., 2002.
Testing of Digital Systems, N. K. Jha and S. Gupta, Cambridge University Press, 2003.
Digital Systems Testing and Testable Design, Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman, IEEE Press, 1994.
VLSI Test Principles and Architectures: Design for Testability, Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, Morgan Kaufmann, 2006.
An Introduction to Logic Circuit Testing, Parag K. Lala, Morgan and Claypool Publishers, 2009.

Contact us

Dr. Manu Basavaraju
Head of the Department
Department of CSE, NITK, Surathkal
P. O. Srinivasnagar, Mangalore - 575 025
Karnataka, India.
Hot line: +91-0824-2474053
Email: hodcse[AT]nitk[DOT]ac[DOT]in


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